태양전지 전면전극에서 발생하는 접촉 비저항에 영향을 주는 요인 비교분석

Abstract

To achieve a silicon solar cell with high cell efficiency, the development of silver paste with low contact resistance between the silver electrode and the silicon solar cell is crucial. However, one of the persistent problems to a silver paste developer is the accurate measurement of contact resistance. Therefore, the factors affecting the contact resistance measurements are investigated in this study. Cause of way of measuring and cause of caculus factor into main cause of measuring contact resistance. Also during laser edge isolation process, depending on laser direction, affects contact resistance and sheet resistance. To top it off, there were influences regarding probing methods, source meter settings, and light during measuring contact resistance. Furthermore, during the process of silver pastes, it affects contact resistance. Main cause was the difference of silver pastes' particle sizes and aging process. Therefore, according to this study, finding effect factors for measurment of resistance will be greatly helpful to reduce trial and error and development period for silver paste developers.